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Electronic Test Equipment Blog

The Electronic Test Equipment Blog is the place for conversation and discussion about test instruments, board & assembly test, inspection & test, test equipment, and anything else related to the electronic testing field. Here, you'll find everything from application ideas, to news and industry trends, to hot topics and cutting edge innovations.

Logarithmic Amplifier Chip Design and Application Considerations

Posted May 03, 2017 12:00 AM by Engineering360 eNewsletter

Able to compress a signal of wide dynamic range to its decibel equivalent, logarithmic amplifier chips produce an output voltage that is directly proportional to the logarithm of an input voltage or current. These chips are often useful in applications involving signal compression.


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Looking at the Test and Measurement Future — From the Voice of Experience

Posted April 09, 2017 12:00 AM by Engineering360 eNewsletter

To examine where we stand in the Red Queen’s race of product quality, National Instruments (NI) recently published its 10th annual Automated Test Outlook, in which Dr. James Truchard capitalizes on his 40 years as CEO to look at the state of the electronics test industry.


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Femtosecond Laser Applications for Additive Manufacturing

Posted March 01, 2017 12:00 AM by Engineering360 eNewsletter

Used for years in subtractive manufacturing for their ability to thermally ablate materials, femtosecond lasers may now have a new application: additive manufacturing technologies. The new fiber lasers could create stronger components and reduce manufacturing time and costs in the healthcare and aerospace industries.


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Design Platform Suits Next-Generation Wearable Tech

Posted December 30, 2016 12:00 AM by Engineering360 eNewsletter

ON Semiconductor will introduce a comprehensive development resource for the wearable electronics sector at the 2017 Consumer Electronics Show. This flexible development kit comprises hardware, firmware, integrated development environment (IDE), and a downloadable SmartApp to support creation of wearables.


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Smart Testing of Aircraft Armaments

Posted November 30, 2016 12:00 AM by Engineering360 eNewsletter

Like other electronic systems, aircraft armaments have undergone an enormous transformation over the past few years. Testing them has become more complicated, as has verifying that a test has found all possible defects. To meet the challenge, a prime defense contractor has developed the common aircraft armaments test set (CAATS) to replace its 25 year old predecessor. This white paper describes one company's response — hardware and associated I/O that makes appropriate use of the new standard, while ensuring that conforming test equipment will not become obsolete as systems under test continue to evolve. The solution ensures accurate, comprehensive tests of aircraft during manufacturing as well as in situ after installation on the aircraft in-service.


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