Login | Register
The Engineer's Place for News and Discussion®


Electronic Test Equipment Blog

The Electronic Test Equipment Blog is the place for conversation and discussion about test instruments, board & assembly test, inspection & test, test equipment, and anything else related to the electronic testing field. Here, you'll find everything from application ideas, to news and industry trends, to hot topics and cutting edge innovations.
Previous in Blog: Are the Walls Closing In?   Next in Blog: Are You Overwhelmed?
Close

Comments Format:






Change Mode
Close

Subscribe to Discussion:

CR4 allows you to "subscribe" to a discussion
so that you can be notified of new comments to
the discussion via email.

Close

Rating Vote:







Add Vote
3 comments
Subscribe Rate this Comments: Nested

Testing Incredible Shrinking Features

Posted June 16, 2011 7:17 AM

Ever-smaller transistors are rapidly approaching the point where we can no longer reliably verify that they work properly. Conventional test and inspection tools at both device and assembly levels no longer suffice. Do test requirements threaten Moore's Law? What do you regard as the biggest obstacles to its continuation? The most likely sources of success? Have you experienced this uncertainty in your own creations? Where does the solution most likely lie? At the design level? Manufacturing? Test? Or some combination?

The preceding article is a "sneak peek" from Electronic Test Equipment, a newsletter from GlobalSpec. To stay up-to-date and informed on industry trends, products, and technologies, subscribe to Electronic Test Equipment today.

Reply

Interested in this topic? By joining CR4 you can "subscribe" to
this discussion and receive notification when new comments are added.
artsmith
Guru
Hobbies - CNC - New Member Popular Science - Biology - New Member Hobbies - Musician - New Member

Join Date: Dec 2008
Location: Canada
Posts: 2671
Good Answers: 119
#1

Re: Testing Incredible Shrinking Features

06/16/2011 5:42 PM

Bring on the teeny tiny test equipment.

__________________
incus opella
Reply
Sleepy
Power-User
Engineering Fields - Systems Engineering - Member for some time now, see my profile.

Join Date: Aug 2007
Location: Essex, UK
Posts: 349
Good Answers: 3
#2

Re: Testing Incredible Shrinking Features

06/18/2011 4:54 AM

Re testing of very small devices.

There has to be some way of testing a device before connection into a circuit, even if this might mean through building the whole circuit? to a point where it can be tested.

It is likely that the test of a very small device might not be a sensible approach.

Then it has to be a go no go test and the whole treated as an assembly that can be junked or used.

My first thought.

Sleepy
Reply
vsar
Power-User

Join Date: May 2010
Location: NYC
Posts: 456
Good Answers: 11
#3

Re: Testing Incredible Shrinking Features

06/18/2011 11:06 AM

Correlating the input and output characteristics always serves the purpose. By inserting that tiny electronic device into a known functional electronic jig, applying known parameter(s) and measuring, predicting or observing the output(s) as an example.

__________________
Anything is possible?
Reply
Reply to Blog Entry 3 comments
Interested in this topic? By joining CR4 you can "subscribe" to
this discussion and receive notification when new comments are added.
Copy to Clipboard

Users who posted comments:

artsmith (1); Sleepy (1); vsar (1)

Previous in Blog: Are the Walls Closing In?   Next in Blog: Are You Overwhelmed?
You might be interested in: Product and Material Test Fixtures and Accessories, Electronic Design Automation (EDA) and Electronic Computer-aided Design (ECAD) Software


"Everything you can imagine is real." -- Pablo Picasso

All times are displayed in US/Eastern (EDT) (Register to change time zone)

Got Something to Say?
Ask a Question
Start a Discussion

Search this Section
Instrumentation:
Go

Search this Blog
Electronic Test Equipment Blog:
Go

Search all of CR4
Go

Recent Blog Entries

Blog Tags
Electronic test failure analysis failure mechanisms future trends in electronic test global competition harry homeland security long term evolution LTE mass transit scanners military test Online shopping for Electronic Equipments R&D Budgets standardized test equipment technology training wire failures

CR4 Sections
Aerospace
BioMech & BioMed
Chemical & Material Science
Civil Engineering
Communications & Electronics
Education and Engineering Careers
Electrical Engineering
General
Instrumentation
Manufacturing
Mechanical Engineering
New Technologies & Research
Software & Programming
Sustainable Engineering
Transportation

Site Directories
Forum Directory
Blog Directory
User Group Directory
RSS Feeds
CR4 Store

CR4 Rules of Conduct
CR4 FAQ
Site Glossary

Who's Online (166 right now)
Show Members