Probe-sharpening Method Set to Improve Microscope Imaging
Posted July 09, 2012 8:46 AM
From The Engineer - News:
A new improvement to an essential microscope component could greatly improve imaging for researchers who study the very small, from cells to computer chips.
Joseph Lyding, a professor of electrical and computer engineering at the University of Illinois, led a group that developed a new microscope probe-sharpening technique. The technique is described in research published in the journal Nature Communications.