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Electronic Test Equipment Blog

The Electronic Test Equipment Blog is the place for conversation and discussion about test instruments, PCB testing, inspection, test strategy and anything else related to the electronic testing field. Here, you'll find everything from application ideas, to news and industry trends, to hot topics and cutting edge innovations. This blog is inspired by the Electronic Test Equipment newsletter from GlobalSpec, which you can subscribe to here.

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Pinpointing Causes for Rare Faults

Posted September 01, 2007 6:00 AM by Sharkles

Not every process anomaly occurs often enough that its cause is obvious. Successful datalogging techniques have to identify subtle process changes and unusual occurrences. This white paper from the Web site of SigmaQuest (registration required) describes the advantages of comprehensive data analysis and storage to permit modifying production processes to avoid/prevent these failures. Although several years old, its message is still not widely adopted by the industry.

The preceding article is a "sneak peek" from Electronic Test Equipment, a newsletter from GlobalSpec. To stay up-to-date and informed on industry trends, products, and technologies, subscribe to Electronic Test Equipment today.


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