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Electronic Test Equipment Blog

The Electronic Test Equipment Blog is the place for conversation and discussion about test instruments, PCB testing, inspection, test strategy and anything else related to the electronic testing field. Here, you'll find everything from application ideas, to news and industry trends, to hot topics and cutting edge innovations. This blog is inspired by the Electronic Test Equipment newsletter from GlobalSpec, which you can subscribe to here.

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Design for Debugging, Test, or Both

Posted September 23, 2007 6:00 AM by Sharkles

Increasing use and complexity of SOC (system-on-chip) designs has design teams giving more thought to supporting debugging rather than test. An EDN article says they need to observe and control from outside the chip, without blowing budgets or schedules. There are a variety of techniques that support these goals; so how do you choose?

The preceding article is a "sneak peek" from Electronic Test Equipment, a newsletter from GlobalSpec. To stay up-to-date and informed on industry trends, products, and technologies, subscribe to Electronic Test Equipment today.


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