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Here, you&#x27;ll find everything from application ideas, to news and industry trends, to hot topics and cutting edge innovations.&#x3c;&#x2f;p&#x3e;]]></description><copyright>Copyright 2026</copyright><pubDate>Wed, 03 May 2017 04:00:00 EST</pubDate><generator>https&#x3a;&#x2f;&#x2f;cr4.globalspec.com</generator><item><title><![CDATA[Logarithmic Amplifier Chip Design and Application Considerations]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;28303&#x2f;Logarithmic-Amplifier-Chip-Design-and-Application-Considerations&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[Able to compress a signal of wide dynamic range to its decibel equivalent, logarithmic amplifier chips produce an output voltage that is directly proportional to the logarithm of an input voltage or current. These chips are often useful in applications involving signal compression.&#xa;&#xa;&#xd;&#xa;-------&#xa;&#xa;Edito]]></description><pubDate>Wed, 03 May 2017 04&#x3a;00&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;28303&#x2f;Logarithmic-Amplifier-Chip-Design-and-Application-Considerations]]></guid><dc:creator>Engineering360 eNewsletter</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[PXI Systems Rival &#x22;Big Iron&#x22; ATE]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;26626&#x2f;PXI-Systems-Rival-Big-Iron-ATE&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[Once relegated to &#x22;small&#x22; testing situations, PXI and PXIe-based modular systems have come of age. From testing multiple-in, multiple-out &#x28;MIMO&#x29; communications antennas to sophisticated semiconductors, the standard has spawned numerous solutions that require large numbers of I&#x2f;O ports. This survey]]></description><pubDate>Sat, 31 Oct 2015 04&#x3a;00&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;26626&#x2f;PXI-Systems-Rival-Big-Iron-ATE]]></guid><dc:creator>Engineering360 eNewsletter</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Trojans Find Their Way into the Hardware]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25899&#x2f;Trojans-Find-Their-Way-into-the-Hardware&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[When people speak of Trojans and other malicious logic, they are usually talking about software. They rarely admit existence of malicious circuitry on a chip.&#xd;  The possible presence of such circuitry represents one powerful &#xd; incentive to continue the fight to keep counterfeit components out of &#xd; t]]></description><pubDate>Mon, 09 Mar 2015 04&#x3a;00&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25899&#x2f;Trojans-Find-Their-Way-into-the-Hardware]]></guid><dc:creator>Chelsey H</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Everyone Knows What a Test Instrument Looks Like ]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25775&#x2f;Everyone-Knows-What-a-Test-Instrument-Looks-Like&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[For years, advances in instrument technology remained largely invisible to the user - or at least benign. Instruments got faster and more powerful, but &#x22;irrelevant&#x22; personality characteristics persisted. Virtual knobs and dials replaced their physical counterparts without changing their feel and fun]]></description><pubDate>Sun, 01 Feb 2015 05&#x3a;00&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25775&#x2f;Everyone-Knows-What-a-Test-Instrument-Looks-Like]]></guid><dc:creator>Engineering360 eNewsletter</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[The Best Way to Test and Not to Test DDR Memories]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25612&#x2f;The-Best-Way-to-Test-and-Not-to-Test-DDR-Memories&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[The proliferation of dual data-rate SDRAMs in computers and computing &#xd; systems of all descriptions over the past two decades has significantly &#xd; complicated the task of testing the devices when compared to their &#xd; single data-rate predecessors. Testing requires strictly controlling clock and data t]]></description><pubDate>Fri, 05 Dec 2014 05&#x3a;00&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;25612&#x2f;The-Best-Way-to-Test-and-Not-to-Test-DDR-Memories]]></guid><dc:creator>Engineering360 eNewsletter</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[The More Things Change&#x2026;]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;24557&#x2f;The-More-Things-Change&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[A wise soul once said that every generalization is false - including this one. For years, printed-circuit-board manufacturers have heard pundits talk about the death of functional test, the death of in-circuit test, boundary scan as a panacea, the increased need for functional test - you get the ide]]></description><pubDate>Wed, 09 Apr 2014 16&#x3a;01&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;24557&#x2f;The-More-Things-Change]]></guid><dc:creator>Engineering360 eNewsletter</dc:creator><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Get the Most Out of Your People]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18873&#x2f;Get-the-Most-Out-of-Your-People&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[Few test operations these days have enough people to comfortably do the jobs that need doing. Unfortunately, limited staff doesn&#x27;t mean that you can set test tasks aside. Tight tolerances, very dense circuitry, and other joys of the modern electronics industry challenge test engineers to &#x22;get it rig]]></description><pubDate>Fri, 20 Jan 2012 12&#x3a;51&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18873&#x2f;Get-the-Most-Out-of-Your-People]]></guid><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Women in the Workplace]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18530&#x2f;Women-in-the-Workplace&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[Ongoing research suggests that in the last several decades, the number of women in responsible positions in business has increased dramatically. Yet even today the proportion declines as you move up the corporate ladder, and progress has slowed in recent years. Explanations vary from different caree]]></description><pubDate>Fri, 16 Dec 2011 12&#x3a;34&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18530&#x2f;Women-in-the-Workplace]]></guid><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Are You Making Yourself Crazy&#x3f;]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18311&#x2f;Are-You-Making-Yourself-Crazy&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[One consequence of the economic conditions over the last few years is that you have fewer people to get the work done. You feel lucky to have your job, so you try extra hard. But the conditions are bound to raise your level of stress. The stress, in turn, can interfere with your productivity and you]]></description><pubDate>Mon, 21 Nov 2011 14&#x3a;07&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18311&#x2f;Are-You-Making-Yourself-Crazy]]></guid><dc:subject>Electronic Test Equipment Blog</dc:subject></item><item><title><![CDATA[Will the Real Steve Jobs Please Stand Up&#x3f;]]></title><link><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18058&#x2f;Will-the-Real-Steve-Jobs-Please-Stand-Up&#x3f;from_rss&#x3d;1]]></link><description><![CDATA[In the wake of Steve Jobs&#x27; death, the avalanche of accolades seems endless. There is no doubt that he fundamentally changed computing and consumer electronics and that his influence will be felt far into the future. But he also has his detractors. One columnist commented&#x3a; &#x22;The Steve Jobs who founded]]></description><pubDate>Fri, 21 Oct 2011 17&#x3a;44&#x3a;00 EST</pubDate><guid><![CDATA[https&#x3a;&#x2f;&#x2f;cr4.globalspec.com&#x2f;blogentry&#x2f;18058&#x2f;Will-the-Real-Steve-Jobs-Please-Stand-Up]]></guid><dc:subject>Electronic Test Equipment Blog</dc:subject></item></channel></rss>