i am currently working in a semiconductor company. and i was given a project regarding the high retest downtime. after first test there is a descent amount of units which failed due to open/short circuit. there are plenty of reasons why this coudlve happened. we were required to use a teradyne j750 tester and a delta edge handler. my main concern is to lessen the number of o/s units and reduce retest time since "retest" in most companies are non value added.
if anybody has any idea or had the same experience as me, your suggestions would help a lot.your help will be greatly appreciated. thank you.
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