Inspect? Or Test?

In electronics manufacturing, increasing complexity and declining feature size push test-strategies to the limit. In recent years, inspection has become an integral part of test strategies to improve results and maximize product quality. Where do you draw the lines? What do you inspect and what do you test? Do the methods overlap? Have throughput constraints forced you to test samples at certain steps in your process rather than inspecting or testing every product? Has sampling compromised your product quality or increased your field-support and warranty costs?

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