Once relegated to "small" testing situations, PXI and PXIe-based modular systems have come of age. From testing multiple-in, multiple-out (MIMO) communications antennas to sophisticated semiconductors, the standard has spawned numerous solutions that require large numbers of I/O ports. This survey examines some of the high-end test situations that PXI can address. One company, for example, offers timing per pin, data formatting, and PMU per pin on up to 512 I/O channels, a test scope previously confined to mainframe-type testers. Another company recently introduced modules aimed specifically at the automobile industry. The survey includes numerous hyperlinks to company sites for additional information.
Editor's Note: This news brief was brought to you by the Electronic Test Equipment eNewsletter. Subscribe today to have content like this delivered to your inbox.
| 
