Testing Incredible Shrinking Features

Ever-smaller transistors are rapidly approaching the point where we can no longer reliably verify that they work properly. Conventional test and inspection tools at both device and assembly levels no longer suffice. Do test requirements threaten Moore's Law? What do you regard as the biggest obstacles to its continuation? The most likely sources of success? Have you experienced this uncertainty in your own creations? Where does the solution most likely lie? At the design level? Manufacturing? Test? Or some combination?

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