High Voltage and Pin-count Component Test

Semiconductor ICs integrate RF, analog, digital, optoelectronic, and microelectronic devices inside the package or on a single die. The process technologies scale according to Moore's Law, with devices operating in low voltage regions of 1V or lower. But what does this mean for the Electrostatic Discharge (ESD) immunity of semiconductor ICs?

The preceding article is a "sneak peek" from Electronic Test Equipment, a newsletter from GlobalSpec. To stay up-to-date and informed on industry trends, products, and technologies, subscribe to Electronic Test Equipment today.